Soft Error Mechanisms, Modeling and Mitigation - Hardcover

Sayil, Selahattin

 
9783319306063: Soft Error Mechanisms, Modeling and Mitigation
Hardcover
ISBN 10: 3319306065 ISBN 13: 9783319306063
Publisher: Springer, 2016

Synopsis

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  

"synopsis" may belong to another edition of this title.

About the Author

Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University.  His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.

From the Back Cover

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  

"About this title" may belong to another edition of this title.

Publisher
Springer
Publication date
2016
Language
English
ISBN 10 
3319306065
ISBN 13 
9783319306063
Binding
Hardcover
Edition number
1
Number of pages
116

Other Popular Editions of the Same Title

9783319808482: Soft Error Mechanisms, Modeling and Mitigation

Featured Edition

ISBN 10:  3319808486 ISBN 13:  9783319808482
Publisher: Springer, 2018
Softcover