Phase Change Memory: Device Physics, Reliability and Applications - Softcover

 
9783319690544: Phase Change Memory: Device Physics, Reliability and Applications

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Synopsis

Chapter 1. Memory overview and PCM introduction.- Chapter 2.Electrical transport in crystalline and amorphous chalcogenides.- Chapter 3.Thermal model and remarkable temperature effects on calcogenide alloys.- Chapter 4.Self-consistent numerical model.- Chapter 5.PCM main reliability features.- Chapter 6.Structure and properties of chalcogenide materials for PCM.- Chapter 7.Material Engineering for PCM Device Optimization.- Chapter 8.PCM scaling.- Chapter 9.PCM device design.- Chapter 10.PCM array architecture and management.- Chapter 11. PCM applications and an outlook to the future.

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Other Popular Editions of the Same Title

9783319690520: Phase Change Memory: Device Physics, Reliability and Applications

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ISBN 10:  3319690523 ISBN 13:  9783319690520
Publisher: Springer, 2017
Hardcover