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Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Mátrafüred, Hungary, September 13 – 17, 1982 (Lecture Notes in Physics, 175) - Softcover

 
9783540119869: Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Mátrafüred, Hungary, September 13 – 17, 1982 (Lecture Notes in Physics, 175)

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9780387119861: Defect Complexes in Semiconductor Structures: Proceedings (Lecture Notes in Physics, 175.)

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Softcover. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-00465 3540119868 Sprache: Englisch Gewicht in Gramm: 550. Seller Inventory # 2482979

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ISBN 10: 3540119868 ISBN 13: 9783540119869
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Softcover. 311 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 3540119868 Sprache: Englisch Gewicht in Gramm: 550. Seller Inventory # 2341026

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Paperback. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.13. Seller Inventory # G3540119868I4N00

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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 320 pp. Englisch. Seller Inventory # 9783540119869

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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 320 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 24314186/202

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Giber, J.|Beleznay, F.|Szep, I. C.|Laszlo, J.
Published by Springer Berlin Heidelberg, 1983
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A technologist s view on defects.- Characterization of impurities and defects by electron paramagnetic resonance and related techniques.- Review of the possibilities of electron microscopy in the identification of defect structures.- Electrical and optical . Seller Inventory # 4881624

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