Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, 209) - Hardcover

Book 109 of 227: Springer Tracts in Modern Physics

Schubert, Mathias

 
9783540232490: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, 209)
Hardcover
ISBN 10: 3540232494 ISBN 13: 9783540232490
Publisher: Springer, 2004

Synopsis

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.

A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

"synopsis" may belong to another edition of this title.

Publisher
Springer
Publication date
2004
Language
English
ISBN 10 
3540232494
ISBN 13 
9783540232490
Binding
Hardcover
Number of pages
207

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9783642062285: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics)

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ISBN 10:  3642062288 ISBN 13:  9783642062285
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