Pattern Recognition with Support Vector Machines: First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings (Lecture Notes in Computer Science, 2388) - Softcover
Synopsis
With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude,forexample,the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over?t control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e?cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings,theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal.
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Pattern Recognition with Support Vector Machines: First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings (Lecture Notes in Computer Science)
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Pattern Recognition with Support Vector Machines
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Springer Berlin Heidelberg Jul 2002, 2002
ISBN 10: 354044016X
ISBN 13: 9783540440161
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude,forexample,th e simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over t control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings,theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal. 438 pp. Englisch. Seller Inventory # 9783540440161
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Pattern Recognition With Support Vector Machines : First International Workshop, Svm 2002, Niagara Falls, Canada, August 10, 2002 : Proceedings
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Pattern Recognition with Support Vector Machines
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Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2002
ISBN 10: 354044016X
ISBN 13: 9783540440161
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Condition: New. These are the refereed proceedings of the First International Workshop on Pattern Recognition with Support Vector Machines, SVM 2002, held in Niagara Falls, Canada in August 2002. Editor(s): Lee, Seong-Whan; Verri, Alessandro. Series: Lecture Notes in Computer Science. Num Pages: 440 pages, biography. BIC Classification: UYQP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 233 x 155 x 22. Weight in Grams: 1350. . 2002. Paperback. . . . . Seller Inventory # V9783540440161
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