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X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons - Hardcover
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
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Language Notes:
Text: English (translation)
Original Language: French
Original Language: French
"About this title" may belong to another edition of this title.
- PublisherSpringer
- Publication date1990
- ISBN 10 3540512225
- ISBN 13 9783540512226
- BindingHardcover
- Edition number1
- Number of pages371
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