X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons

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9783540512226: X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

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Text: English (translation)
Original Language: French

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DRITS V.A. & TCHOUBAR C.
Published by Sringer-Verlag, 1990, (1990)
ISBN 10: 3540512225 ISBN 13: 9783540512226
Used Hardcover Quantity Available: 1
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ALBERT BLANCHARD
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Book Description Sringer-Verlag, 1990, 1990. Couverture rigide. Book Condition: Bon. 371 pp., 23x15. Reliure éditeur. Bon état. Livre d'occasion. Bookseller Inventory # 29864

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