High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics) - Hardcover

Holy, Vaclav; Pietsch, Ullrich; Baumbach, Tilo

 
9783540620297: High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
Hardcover
ISBN 10: 354062029X ISBN 13: 9783540620297
Publisher: Springer, 1998

Synopsis

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

"synopsis" may belong to another edition of this title.

From the Back Cover

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

"About this title" may belong to another edition of this title.

Publisher
Springer
Publication date
1998
Language
English
ISBN 10 
354062029X
ISBN 13 
9783540620297
Binding
Hardcover
Number of pages
258