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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45) - Hardcover
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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis: 45 (Springer Series in Optical Sciences, 45)
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Scanning electron microscopy : physics of image formation and microanalysis. Springer series in optical sciences ; Vol. 45
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Berlin ; Heidelberg ; Tokyo ; New York ; Barcelona ; Budapest ; Hong Kong ; London ; Milan ; Paris ; Singapore : Springer, 1998
ISBN 10: 3540639764
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Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
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Condition: Gut. Zustand: Gut | Seiten: 544 | Sprache: Englisch | Produktart: Bücher | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. Seller Inventory # 706699/3
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
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Scanning Electron Microscopy
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Scanning Electron Microscopy
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Springer Berlin Heidelberg, 1998
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Main benefit is information about the physics of image formation and microanalysis in scanning electron microscopy2nd, completely revised and updated editionMain benefit is information about the physics of image formation and microanalysis in sca. Seller Inventory # 458677204
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Scanning Electron Microscopy
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Springer Vieweg, Springer Sep 1998, 1998
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. 544 pp. Englisch. Seller Inventory # 9783540639763
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