Scanning Tunneling Microscopy and Its Application (Springer Series in Surface Sciences)

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9783540657156: Scanning Tunneling Microscopy and Its Application (Springer Series in Surface Sciences)

This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining novel scanning-probe techniques and the instrumentation and methods, the book provides detailed accounts of STM applications. It examines limitations of the present-day investigations and provides insight into further trends.
"I strongly recommend that Professor Bai's book be a part of any library that serves surface scientists, biochemists, biophysicists, material scientists, and students of any science or engineering field...There is no doubt that this is one of the better (most thoughtful) texts."
Journal of the American Chemical Society (Review of 1/e)

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Text: English (translation)
Original Language: Chinese

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Book Description Springer-Verlag Gmbh Jan 1995, 1995. Buch. Book Condition: Neu. 241x162x19 mm. Neuware - Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field. 320 pp. Deutsch. Bookseller Inventory # 9783540657156

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Book Description Springer-Verlag Gmbh Jan 1995, 1995. Buch. Book Condition: Neu. 241x162x19 mm. Neuware - Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field. 320 pp. Deutsch. Bookseller Inventory # 9783540657156

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Book Description Springer-Verlag Gmbh Jan 1995, 1995. Buch. Book Condition: Neu. 241x162x19 mm. Neuware - Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field. 320 pp. Deutsch. Bookseller Inventory # 9783540657156

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