Items related to Software Process and Product Measurement: International...
Software Process and Product Measurement: International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. ... (Lecture Notes in Computer Science, 5338) - Softcover
Synopsis
This book constitutes the refereed proceedings of three joint events - the International Workshop on Software Measurement, IWSM 2008, the DASMA Metrik Kongress, Metrikon 2008, and the International Conference on Software Process and Product Measurement, Mensura 2008, held in Munich, Germany, in November 2008. The 30 revised full papers presented were carefully reviewed and selected from over 50 submissions for inclusion in the book. The papers are organized in topical sections on estimation models, measurement methodology, effort estimation, measurement programs, new approaches, prozessbewertung, size measurement, education, measurement in software lifecycle, and product measurement.
"synopsis" may belong to another edition of this title.
From the Back Cover
This book constitutes the refereed proceedings of three joint events - the International Workshop on Software Measurement, IWSM 2008, the DASMA Metrik Kongress, Metrikon 2008, and the International Conference on Software Process and Product Measurement, Mensura 2008, held in Munich, Germany, in November 2008.
The 30 revised full papers presented were carefully reviewed and selected from over 50 submissions for inclusion in the book. The papers are organized in topical sections on estimation models, measurement methodology, effort estimation, measurement programs, new approaches, prozessbewertung, size measurement, education, measurement in software lifecycle, and product measurement.
"About this title" may belong to another edition of this title.
Search results for Software Process and Product Measurement: International...
Stock Image
Software Process and Product Measurement: International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. . / Programming and Software Engineering)
Seller: GuthrieBooks, Spring Branch, TX, U.S.A.
Seller rating 5 out of 5 stars
Paperback. Condition: Very Good. Ex-library paperback in very nice condition with the usual markings and attachments. Seller Inventory # DA1412733
Quantity: 1 available
Stock Image
Software Process And Product Measurement
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Seller Inventory # ABNR-157699
Quantity: 1 available
Stock Image
Software Process And Product Measurement
Seller: Basi6 International, Irving, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Seller Inventory # ABEJUNE24-271470
Quantity: 1 available
Stock Image
SOFTWARE PROCESS AND PRODUCT MEASUREMENT: INTERNATIONAL CONFERENCES IWSM 2008, METRIKON 2008, AND MENSURA 2008 MUNICH, GERMANY, NOVEMBER 18-19, 2008. PROCEEDINGS
Seller: Basi6 International, Irving, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Seller Inventory # ABEJUNE24-356362
Quantity: 1 available
Stock Image
Software Process and Product Measurement: International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. ... (Lecture Notes in Computer Science, 5338)
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # ABLIING23Mar3113020177922
Quantity: Over 20 available
Stock Image
Software Process and Product Measurement: International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. ... (Lecture Notes in Computer Science, 5338)
Seller: Best Price, Torrance, CA, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. SUPER FAST SHIPPING. Seller Inventory # 9783540894025
Quantity: 2 available
Stock Image
Software Process and Product Measurement: International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. ... (Lecture Notes in Computer Science, 5338)
Seller: ALLBOOKS1, Direk, SA, Australia
Seller rating 5 out of 5 stars
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address. Seller Inventory # SHUB271470
Quantity: 1 available
Stock Image
SOFTWARE PROCESS AND PRODUCT MEASUREMENT : INTERNATIONAL CONFERENCES IWSM 2008, METRIKON 2008, AND MENSURA 2008 MUNICH, GERMANY, NOVEMBER 18-19, 2008. PROCEEDINGS
Seller: Basi6 International, Irving, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Seller Inventory # ABEJUNE24-271471
Quantity: 1 available
Stock Image
Software Process and Product Measurement: International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. ... (Lecture Notes in Computer Science, 5338)
Seller: ALLBOOKS1, Direk, SA, Australia
Seller rating 5 out of 5 stars
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address. Seller Inventory # SHUB356362
Quantity: 1 available
Stock Image
Software Process and Product Measurement: International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. ... (Lecture Notes in Computer Science, 5338)
Seller: ALLBOOKS1, Direk, SA, Australia
Seller rating 5 out of 5 stars
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address. Seller Inventory # SHUB271471
Quantity: 1 available