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Synopsis
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
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Review
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"Vol. XII contains nine contributions ... of SPM applications on a variety of systems including biological systems for the measurement of receptor-ligand interaction, the imaging of chemical groups on living cells, and the imaging of chemical groups on live cells. These biological applications are complemented by nearfield optical microscopy in life science ... . Each chapter ... will make profitable reading for researchers at all experience levels. ... All the chapters are ... beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)
“The articles ... are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. ... highlight various studies, techniques and applications that permit us to image, modify, fabricate and control structures at the molecular and atomic level. ... well-written and clearly illustrated.” (Barry R. Masters, Optics & Photonics News, September, 2009)"About this title" may belong to another edition of this title.
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Applied Scanning Probe Methods XII
Published by
Springer Berlin Heidelberg, 2010
ISBN 10: 3642098703
ISBN 13: 9783642098703
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Seller: moluna, Greven, Germany
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state of the art of this techniqueReal industrial applications includedCrack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical . Seller Inventory # 5048862
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Applied Scanning Probe Methods XII
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Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 3642098703
ISBN 13: 9783642098703
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Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1¿4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors¿ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 280 pp. Englisch. Seller Inventory # 9783642098703
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Applied Scanning Probe Methods XII : Characterization
Published by
Springer Berlin Heidelberg, 2010
ISBN 10: 3642098703
ISBN 13: 9783642098703
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Taschenbuch
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1-4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors' knowledge, this was shown for the rst time by Hild et al. in [5]. 16. Seller Inventory # 9783642098703
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Applied Scanning Probe Methods XII: Characterization
Seller: Revaluation Books, Exeter, United Kingdom
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Paperback. Condition: Brand New. reprint edition. 280 pages. 9.00x6.00x0.66 inches. In Stock. Seller Inventory # 3642098703
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Applied Scanning Probe Methods XII
Published by
Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 3642098703
ISBN 13: 9783642098703
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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1-4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors' knowledge, this was shown for the rst time by Hild et al. in [5]. 16. 280 pp. Englisch. Seller Inventory # 9783642098703
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Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology)
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