Dependence in Probability and Statistics (Lecture Notes in Statistics, 200) - Softcover

Softcover

ISBN 10: 364214103X ISBN 13: 9783642141034

Publisher: Springer, 2010

Synopsis

This volume contains several contributions on the general theme of dependence for several classes of stochastic processes, andits implicationson asymptoticproperties of various statistics and on statistical inference issues in statistics and econometrics. The chapter by Berkes, Horváth and Schauer is a survey on their recent results on bootstrap and permutation statistics when the negligibility condition of classical central limit theory is not satis ed. These results are of interest for describing the asymptotic properties of bootstrap and permutation statistics in case of in nite va- ances, and for applications to statistical inference, e.g., the change-point problem. The paper by Stoev reviews some recent results by the author on ergodicity of max-stable processes. Max-stable processes play a central role in the modeling of extreme value phenomena and appear as limits of component-wise maxima. At the presenttime,arathercompleteandinterestingpictureofthedependencestructureof max-stable processes has emerged,involvingspectral functions, extremalstochastic integrals, mixed moving maxima, and other analytic and probabilistic tools. For statistical applications, the problem of ergodicity or non-ergodicity is of primary importance.

About this title

From the Back Cover

This volume collects recent works on weakly dependent, long-memory and multifractal processes and introduces new dependence measures for studying complex stochastic systems. Other topics include the statistical theory for bootstrap and permutation statistics for infinite variance processes, the dependence structure of max-stable processes, and the statistical properties of spectral estimators of the long memory parameter. The asymptotic behavior of Fejér graph integrals and their use for proving central limit theorems for tapered estimators are investigated. New multifractal processes are introduced and their multifractal properties analyzed. Wavelet-based methods are used to study multifractal processes with different multiresolution quantities, and to detect changes in the variance of random processes. Linear regression models with long-range dependent errors are studied, as is the issue of detecting changes in their parameters.

Edition details

• Publisher: Springer
• Publication date: 2010
• Language: English
• ISBN 10: 364214103X
• ISBN 13: 9783642141034
• Binding: Paperback
• Edition number: 1
• Number of pages: 220
• Editor: Doukhan Paul, Lang Gabriel, Surgailis Donatas, Teyssičre Gilles