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Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology) - Hardcover
Synopsis
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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Review
“The book attempts to provide a technical, theoretical, and conceptual framework to understand how SPM works and what can be done with it so that a reader wishing to further learn about newer topics will have the basis to do so. This book could thus serve as a useful reference and textbook for anyone desiring an advanced introduction to the fascinating world of SPM.” (Sidney Cohen, MRS Bulletin, Vol. 41, February, 2016)
“The contents of this book are presented in a very clear didactic manner ... . In addition, it includes the foundations of many technical aspects that are not necessarily a part of the methods themselves, but which in practice are required for the application. ... What I particularly like, is the fact that it discusses common artefacts occurring in scanning tunneling microscopy. Such discussions are rare in the literature, although they are essential for a complete training of young scientists. To my mind the book is well suited not only for physicists, but also for chemists, materials and nano-scientists and others with similar background.” (Quote translated from German, Jascha Repp, Physik Journal, issue 4, 2016)"About this title" may belong to another edition of this title.
- PublisherSpringer
- Publication date2015
- ISBN 10 3662452391
- ISBN 13 9783662452394
- BindingHardcover
- LanguageEnglish
- Number of pages397
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Scanning Probe Microscopy : Atomic Force Microscopy and Scanning Tunneling Microscopy
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Scanning Probe Microscopy
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ISBN 10: 3662452391
ISBN 13: 9783662452394
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Scanning Probe Microscopy
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ISBN 10: 3662452391
ISBN 13: 9783662452394
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Buch. Condition: Neu. Neuware -This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. 400 pp. Englisch. Seller Inventory # 9783662452394
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Scanning Probe Microscopy
Published by
Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2015, 2015
ISBN 10: 3662452391
ISBN 13: 9783662452394
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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. 400 pp. Englisch. Seller Inventory # 9783662452394
Quantity: 1 available
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Scanning Probe Microscopy
Published by
Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2015, 2015
ISBN 10: 3662452391
ISBN 13: 9783662452394
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Hardcover
Seller: Wegmann1855, Zwiesel, Germany
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Buch. Condition: Neu. Neuware -This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. Seller Inventory # 9783662452394
Quantity: 1 available