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Physical and Technical Problems of SOI Structures and Devices: 3 (Closed)) (NATO Science Partnership Subseries: 3) - Softcover
Synopsis
In Physical and Technical Problems of SOI Structures and Devices, specialists in silicon-on-insulator technology from both East and West meet for the first time, giving the reader the chance to become acquainted with work from the former Soviet Union, hitherto only available in Russian and barely available to western scientists. Keynote lectures and state-of-the-art presentations give a wide-ranging panorama of the challenges posed by SOI materials and devices, material fabrication techniques, characterisation, device and circuit issues.
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About the Author
Jean-Pierre Colinge is a Director at the Taiwan Semiconductor Manufacturing Company (TSMC). He is a Fellow of the IEEE and the TSMC and received the IEEE Andrew Grove Award in 2012. He has over 35 years' experience in conducting research on semiconductor devices and has authored several books on the topic.
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Physical and Technical Problems of Soi Structures and Devices
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Physical and Technical Problems of SOI Structures and Devices (Paperback)
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Paperback. Condition: new. Paperback. In Physical and Technical Problems of SOI Structures and Devices, specialists in silicon-on-insulator technology from both East and West meet for the first time, giving the reader the chance to become acquainted with work from the former Soviet Union, hitherto only available in Russian and barely available to western scientists. Keynote lectures and state-of-the-art presentations give a wide-ranging panorama of the challenges posed by SOI materials and devices, material fabrication techniques, characterisation, device and circuit issues. In Physical and Technical Problems of SOI Structures and Devices, specialists in silicon-on-insulator technology from both East and West meet for the first time, giving the reader the chance to become acquainted with work from the former Soviet Union, hitherto only available in Russian and barely available to western scientists. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9789401040525
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Physical and Technical Problems of SOI Structures and Devices: 3 (Closed)) (NATO Science Partnership Subseries: 3)
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Physical and Technical Problems of Soi Structures and Devices
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Physical and Technical Problems of SOI Structures and Devices: 3 (Closed)) (NATO Science Partnership Subseries: 3)
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Physical and Technical Problems of Soi Structures and Devices (Nato Science Partnership Subseries: 3 (Closed))
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Physical and Technical Problems of SOI Structures and Devices
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Springer Netherlands, Springer Okt 2012, 2012
ISBN 10: 9401040524
ISBN 13: 9789401040525
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In Physical and Technical Problems of SOI Structures and Devices, specialists in silicon-on-insulator technology from both East and West meet for the first time, giving the reader the chance to become acquainted with work from the former Soviet Union, hitherto only available in Russian and barely available to western scientists. Keynote lectures and state-of-the-art presentations give a wide-ranging panorama of the challenges posed by SOI materials and devices, material fabrication techniques, characterisation, device and circuit issues. 304 pp. Englisch. Seller Inventory # 9789401040525
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Physical and Technical Problems of SOI Structures and Devices (Nato Science Partnership Subseries: 3 (closed))
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Paperback. Condition: Brand New. reprint edition. 300 pages. 9.40x6.20x0.80 inches. In Stock. Seller Inventory # x-9401040524
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