Advanced Experimental Methods For Noise Research In Nanoscale Electronic Devices : Proceedings Of The Nato Advanced Research Workshop, Brno, Czech Republic, 2003

Sikula, Josef (EDT); Levinshtein, Michael E. (EDT); NATO Advanced Research Workshop on Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices (2003 : Brno, Czech Republic) (COR)

ISBN 10: 1402021682 ISBN 13: 9781402021688
Published by Springer, 2004
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A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.

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Title: Advanced Experimental Methods For Noise ...
Publisher: Springer
Publication Date: 2004
Binding: Hardcover
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Published by Springer, 2004
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Sikula, Josef
Published by Springer, 2004
ISBN 10: 1402021682 ISBN 13: 9781402021688
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Josef Sikula
Published by Springer Jul 2004, 2004
ISBN 10: 1402021682 ISBN 13: 9781402021688
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Buch. Condition: Neu. Neuware - A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future. Seller Inventory # 9781402021688

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