Title: Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Publisher: CRC Press
Publication Date: 2024
Language: English
ISBN 10: 1032375116
ISBN 13: 9781032375113
Binding: Soft cover
Condition: New

About this title

Synopsis

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:

Covers material characterization techniques and the development of advanced characterization technology
Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
Discusses advanced material characterization technology in the microstructural and property characterization fields
Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

"About this title" may belong to another edition of this title.

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