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Advanced Materials Characterization | Basic Principles, Novel Applications, and Future Directions | Ch Sateesh Kumar (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2024 | Taylor & Francis Ltd | EAN 9781032375113 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu. Seller Inventory # 130236219
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.
Features:
This book is aimed at graduate students and researchers in materials science and engineering.
Title: Advanced Materials Characterization | Basic ...
Publisher: Taylor & Francis Ltd
Publication Date: 2024
Binding: Taschenbuch
Condition: Neu