Title: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Publisher: Springer
Publication Date: 2010
Language: English
ISBN 10: 904817855X
ISBN 13: 9789048178551
Binding: Soft cover
Condition: New

About this title

Synopsis

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

About the Author

Prof. Sachdev has authored several successful books with Springer

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