Pavlov Andrei (51 results)

Language: English
Published by Taylor & Francis Group 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: Better World Books, Mishawaka, IN, U.S.A.Better World Books
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US$ 7.60
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Condition: Good. 1 Edition. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Language: English
Published by Routledge 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: HPB-Ruby, Dallas, TX, U.S.A.HPB-Ruby
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US$ 5.00
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Paperback. Condition: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority.

Published by British Library, Historical Print Editions 6/23/2011 2011
- Softcover
Seller: BargainBookStores, Grand Rapids, MI, U.S.A.BargainBookStores
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US$ 14.52
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Paperback or Softback. Condition: New. ??????? ????????? ?????&. Book.

Language: Ukrainian
Published by British Library, Historical Print Editions 2011
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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US$ 11.87
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Condition: New.

Language: Ukrainian
Published by British Library, Historical Print Editions 2011
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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US$ 12.66
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Condition: As New. Unread book in perfect condition.

Language: English
Published by Springer Nature (Sie) 2011
Series: Frontiers in Electronic Testing, Book 21 of 40. Book 21 of 40 - Frontiers in Electronic Testing
Seller: Books in my Basket, New Delhi, IndiaBooks in my Basket
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US$ 14.14
US$ 22.78 shippingShips from India to U.S.A.Quantity: 4 available
N.A. Condition: New. ISBN:9788132202325.

Language: English
Published by Routledge 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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US$ 51.58
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Condition: As New. Unread book in perfect condition.

Language: Ukrainian
Published by British Library, Historical Print Editions 2011
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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US$ 20.27
US$ 15.81 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.

Language: Ukrainian
Published by British Library, Historical Print Editions 2011
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 18.76
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Condition: As New. Unread book in perfect condition.

Language: English
Published by Routledge 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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US$ 63.34
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Condition: New.

Language: Ukrainian
Published by British Library, Historical Print Editions 2011
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 20.26
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Condition: New.

Language: English
Published by Longman Group 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
US$ 99.57
US$ 3.99 shippingShips within U.S.A.Quantity: 3 available
Condition: New. pp. 248.

Language: English
Published by Routledge 2003-08-27 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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US$ 93.53
US$ 20.45 shippingShips from United Kingdom to U.S.A.Quantity: 10 available
Paperback. Condition: New.

Language: English
Published by Longman Group 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
US$ 105.69
US$ 11.33 shippingShips from Germany to U.S.A.Quantity: 3 available
Condition: New. pp. 248.

Language: English
Published by Routledge 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 96.60
US$ 19.80 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New.

Language: English
Published by Taylor & Francis 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 79.49
US$ 55.81 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New.

Language: English
Published by Longman Pub Group 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 130.11
US$ 13.20 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Paperback. Condition: Brand New. 1st edition. 248 pages. 8.25x5.25x0.50 inches. In Stock.

Language: English
Published by Routledge 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 137.30
US$ 19.80 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: As New. Unread book in perfect condition.

Language: English
Published by Routledge 2003
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
US$ 126.44
US$ 33.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Like New. Like New. book.

Language: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 21 of 40. Book 21 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 187.41
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Condition: New. In.

Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 21 of 40. Book 21 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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US$ 200.57
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Condition: New.

Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 21 of 40. Book 21 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 187.38
US$ 19.80 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.

Language: English
Published by Routledge 2016
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 208.06
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Condition: As New. Unread book in perfect condition.

Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 21 of 40. Book 21 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Buchpark, Trebbin, GermanyBuchpark
Contact seller5-star sellerCondition: Used - Fine
US$ 106.44
US$ 119.61 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process disturbances and various defect mechanisms contribute to the increasing number of unstable SRAM cells with…parametric sensitivity. Growing sizes of SRAM arrays increase the likelihood of cells with marginal stability and pose strict constraints on transistor parameters distributions.Standard functional tests often fail to detect unstable SRAM cells. Undetected unstable cells deteriorate quality and reliability of the product as such cells may fail to retain the data and cause a system failure. Special design and test measures have to be taken to identify cells with marginal stability. However, it is not sufficient to identify the unstable cells. To ensure reliable system operation, unstable cells have to be repaired. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 21 of 40. Book 21 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Buchpark, Trebbin, GermanyBuchpark
Contact seller5-star sellerCondition: Used
US$ 109.63
US$ 119.61 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process disturbances and various defect mechanisms contribute to the increasing number of unstable SRAM cel…ls with parametric sensitivity. Growing sizes of SRAM arrays increase the likelihood of cells with marginal stability and pose strict constraints on transistor parameters distributions.Standard functional tests often fail to detect unstable SRAM cells. Undetected unstable cells deteriorate quality and reliability of the product as such cells may fail to retain the data and cause a system failure. Special design and test measures have to be taken to identify cells with marginal stability. However, it is not sufficient to identify the unstable cells. To ensure reliable system operation, unstable cells have to be repaired. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Language: English
Published by Routledge 2016
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 215.67
US$ 19.80 shippingShips from United Kingdom to U.S.A.Quantity: 10 available
Condition: As New. Unread book in perfect condition.

Language: English
Published by Routledge 2016
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 232.87
US$ 2.64 shippingShips within U.S.A.Quantity: 10 available
Condition: New.

Language: English
Published by Routledge 2016
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
US$ 226.94
US$ 8.58 shippingShips from United Kingdom to U.S.A.Quantity: 3 available
Condition: New. pp. 244.

Language: English
Published by Routledge 2016
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 223.30
US$ 19.80 shippingShips from United Kingdom to U.S.A.Quantity: 10 available
Condition: New.

Language: English
Published by Routledge 2016
Series: Profiles In Power, Book 32 of 51. Book 32 of 51 - Profiles In Power
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
US$ 240.80
US$ 3.99 shippingShips within U.S.A.Quantity: 3 available
Condition: New. pp. 244.