CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

Pavlov, Andrei; Sachdev, Manoj

ISBN 10: 1402083629 / ISBN 13: 9781402083624

Published by Springer, 2008

About this Item

Like New.

Seller Inventory # ERICA77314020836296

Bibliographic Details

• Title: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)
• Publisher: Springer
• Publication Date: 2008
• Language: English
• ISBN 10: 1402083629
• ISBN 13: 9781402083624
• Binding: Hardcover
• Condition: Like New
• Book Type: book

About this title

Synopsis

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

About the Author

Prof. Sachdev has authored several successful books with Springer