Title: CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Publisher: Springer
Publication Date: 2010
Language: English
ISBN 10: 904817855X
ISBN 13: 9789048178551
Binding: Soft cover
Condition: New

About this title

Synopsis

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

About the Author

Prof. Sachdev has authored several successful books with Springer

"About this title" may belong to another edition of this title.

Store Description

We specialise in General Interest Books from South Asian countries.

Visit Seller's Storefront

Seller's business information

BOOKS AND PERIODICALS AGENCY LTD
90 Barnet Gate Lane, Barnet, EN5 2AX, United Kingdom

Sale & Shipping Terms

Terms of Sale

Returns accepted if you are not satisfied with the Service or Book.

Shipping Terms

Best packaging and fast delivery

Shipping rates from United Kingdom to U.S.A.

Shipping rates from United Kingdom to U.S.A.
Order quantity	14 to 45 business days	5 to 10 business days
First item	US$ 8.76	US$ 13.28

Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.