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hardcover. Condition: As New. Ships Out Tomorrow!
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Book 21 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 189.94
US$ 16.15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Book 21 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 189.93
US$ 20.22 shipping
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing (40))
Book 21 of 40: Frontiers in Electronic TestingUS$ 288.83
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Add to basketPaperback. Condition: Like New. Like New. book.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Book 21 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 331.87
US$ 20.22 shipping
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Add to basketCondition: As New. Unread book in perfect condition.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)
Book 21 of 40: Frontiers in Electronic TestingUS$ 320.77
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Add to basketHardcover. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Book 21 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer Netherlands, 2008
ISBN 10: 1402083629 ISBN 13: 9781402083624
US$ 175.22
US$ 57.04 shipping
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
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CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Book 21 of 40: Frontiers in Electronic TestingUS$ 261.72
US$ 8.76 shipping
Ships from United Kingdom to U.S.A.Quantity: 4 available
Add to basketCondition: New. Print on Demand pp. 212 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Condition: New. PRINT ON DEMAND pp. 212.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Book 21 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer Netherlands, 2010
ISBN 10: 904817855X ISBN 13: 9789048178551
US$ 173.81
US$ 57.04 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
