CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
Language: English
Published by Springer, 2010
- Softcover
- New
Seller: Biblios, frankfurt am main, hessen, GermanyBiblios
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Condition: New
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- Title
- CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
- Author
- Pavlov Andrei Sachdev Manoj
- Publisher
- Springer
- Publication year
- 2010
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 904817855X
- ISBN 13
- 9789048178551
- Series
- Book 21 of 40: Frontiers in Electronic Testing
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
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Biblios
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