Title: Characterisation of Radiation Damage by Transmission Electron Microscopy
Publisher: Inst of Physics Pub Inc
Publication Date: 2000
Language: English
ISBN 10: 075030748X
ISBN 13: 9780750307482
Binding: Hardcover
Condition: Brand New
Weight: 0.55 kilograms

About this title

Synopsis

Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

About the Author

M.L Jenkins, M.A Kirk

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