Computed electron micrographs and defect identification.

Head, A. K., P. Humble, L. M. Clarebrough, A. J. Morton and C. T. Forwood.

Published by Amsterdam, North-Holland Publ. Comp. 1973.
Condition: Used Hardcover

Sold by Antiquariat Löcker, Wien, Austria

Association Member:

AbeBooks Seller since March 24, 2011

Seller rating 4 out of 5 stars 4-star rating, Learn more about seller ratings

View this seller's items


Used - Hardcover

Price:
US$ 35.32
US$ 85.72 shipping
Ships from Austria to U.S.A.

Quantity: 1 available

Add to basket