Fundamentals Of Modern Vlsi Devices, Second Edition

Yuan Taur & Tak H. Ning

ISBN 10: 1107635713 / ISBN 13: 9781107635715

Published by Cambridge University Press, 2013

About this Item

New.SoftCover International edition. Different ISBN and Cover image but contents are same as US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Seller Inventory # ABEJUNE24-162420

Bibliographic Details

• Title: Fundamentals Of Modern Vlsi Devices, Second Edition
• Publisher: Cambridge University Press
• Publication Date: 2013
• Language: English
• ISBN 10: 1107635713
• ISBN 13: 9781107635715
• Binding: Soft cover
• Edition: 2nd Edition, International Edition
• Condition: Brand New

About this title

Synopsis

Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.

About the Authors

Yuan Taur is a Professor of Electrical and Computer Engineering at the University of California, San Diego. He spent twenty years at IBM's T. J. Watson Research Center where he won numerous invention and achievement awards. He is an IEEE Fellow, Editor-in-Chief of IEEE Electron Device Letters, and holds thirteen US patents.

Tak H. Ning is an IBM Fellow at the T. J. Watson Research Center, New York, where he has worked for over 35 years. A Fellow of the IEEE and the American Physical Society and a member of the US National Academy of Engineering, he has authored more than 120 technical papers and holds 36 US patents. He has won several awards, including the ECS 2007 Gordon E. Moore Medal, the IEEE 1991 Jack A. Morton Award and the 1998 Pan Wen-Yuan Foundation Outstanding Research Award.