High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
Adams, R. Dean
ISBN 10: 1402072554 ISBN 13: 9781402072550
Published by Springer, 2002
New
Hardcover
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Kennys Bookstore, Olney, MD, U.S.A.
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About this Item
Description:
2002. Hardcover. . . . . . Books ship from the US and Ireland. Seller Inventory # V9781402072550
Synopsis:
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Review:
From the reviews:
"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)
"About this title" may belong to another edition of this title.
Bibliographic Details
Title: High Performance Memory Testing: Design ...
Publisher: Springer
Publication Date: 2002
Binding: Hardcover
Condition: New
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High Performance Memory Testing
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Springer US, Springer US Sep 2002, 2002
ISBN 10: 1402072554
ISBN 13: 9781402072550
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 266 pp. Englisch. Seller Inventory # 9781402072550
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. 266 pp. Englisch. Seller Inventory # 9781402072550
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High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
Published by
Springer US, Springer US, 2002
ISBN 10: 1402072554
ISBN 13: 9781402072550
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. Seller Inventory # 9781402072550
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High Performance Memory Testing (Hardcover)
Published by
Kluwer Academic Publishers, New York, NY, 2002
ISBN 10: 1402072554
ISBN 13: 9781402072550
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