Key Concepts of Scanning Electron Microscopy

Language: English

Published by ML Books International - IPS, 2015

1632383063 / 9781632383068

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Seller: moluna, Greven, Germanymoluna

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. KlappentextThis book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEM.

Seller Inventory # 10092143

Title
Key Concepts of Scanning Electron Microscopy
Publisher
ML Books International - IPS
Publication year
2015
Condition
New
Binding
Gebunden
Language
English
ISBN 10
1632383063
ISBN 13
9781632383068

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
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