LSI/VLSI Testability Design.
Tsui, Frank F.
Published by McGraw-Hill New York, 1986
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Soft cover
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Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germany
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701 S. Sehr guter Zustand/ very good Ex-Library. With ill. Sprache: Englisch Gewicht in Gramm: 811 Paperback/ broschiert broschiert/ Taschenbuch. Seller Inventory # 465085
Bibliographic Details
Title: LSI/VLSI Testability Design.
Publisher: McGraw-Hill New York
Publication Date: 1986
Binding: Soft cover
Condition: Sehr gut
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Lsi/Vlsi Testability Design
Seller: HPB-Red, Dallas, TX, U.S.A.
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_428413124