Title: Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition)
Publisher: Artech House Publishers
Publication Date: 1989
Language: English
ISBN 10: 0890062846
ISBN 13: 9780890062845
Binding: Hardcover
Condition: New

About this title

Synopsis

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

About the Author

Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.

Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.

Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.

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