Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library)
Language: English
Published by Artech House Publishers, 1989
- Hardcover
- New
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- Title
- Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library)
- Publisher
- Artech House Publishers
- Publication year
- 1989
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0890062846
- ISBN 13
- 9780890062845
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
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About the Author
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
"About the title" may belong to another edition of this title.
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