Title: Particle Characterization in Technology, Vol. 2: Morphological Analysis
Publisher: CRC Press
Publication Date: 1984
Language: English
ISBN 10: 0849357853
ISBN 13: 9780849357855
Binding: Hardcover
Condition: New

About this title

Synopsis

Book by Beddow, John Keith

"About this title" may belong to another edition of this title.

Store Description

Visit Seller's Storefront

Seller's business information

SHIMEDIA
NY, U.S.A.

Sale & Shipping Terms

Terms of Sale

Shipping Terms

Shipping rates within U.S.A.

Shipping rates within U.S.A.
Order quantity	5 to 14 business days	5 to 14 business days
First item	US$ 0.00	US$ 14.00

Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.