Pattern Recognition with Support Vector Machines : First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings

Language: English

Published by Springer, 2002

354044016X / 9783540440161

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Druck auf Anfrage Neuware - Printed after ordering - With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude,forexample,the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over t control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings,theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal.

Seller Inventory # 9783540440161

Title
Pattern Recognition with Support Vector Machines : First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings
Author
Seong-Whan Lee
Publisher
Springer
Publication year
2002
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
354044016X
ISBN 13
9783540440161
Item weight
660 grams
Dimensions
235x155x24 mm

AHA-BUCH GmbH

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