Pattern Recognition with Support Vector Machines: First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings: 2388 (Lecture Notes in Computer Science, 2388)

Seong-Whan Lee, Alessandro Verri

ISBN 10: 354044016X / ISBN 13: 9783540440161

Published by Springer, 2002

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Seller Inventory # LU-9783540440161

Bibliographic Details

• Title: Pattern Recognition with Support Vector Machines: First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings: 2388 (Lecture Notes in Computer Science, 2388)
• Publisher: Springer
• Publication Date: 2002
• Language: English
• ISBN 10: 354044016X
• ISBN 13: 9783540440161
• Binding: Paperback
• Edition: 2002nd.
• Condition: New
• Dimensions: 15.49W x 2.54H x 23.5D centimeters 15.49 centimeters width by 2.54 centimeters height by 23.5 centimeters depth
• Weight: 635 grams

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Synopsis

With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude,forexample,the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over?t control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e?cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings,theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal.