Point Defects in Semiconductors II. Experimental Aspects. Springer Series in Solid-State Sciences; Vol. 35.

Bourgoin, J. and Lannoo, M.:

Published by Berlin: Springer., 1983

Language: English

Condition: Used - Very good Hardcover

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295 p., with numerous figures, Good condition. Ex-Library with usual markings. Sprache: Englisch Gewicht in Gramm: 725.

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Bibliographic Details

Title

Point Defects in Semiconductors II. Experimental Aspects. Springer Series in Solid-State Sciences; Vol. 35.

Publisher

Berlin: Springer.

Publication Date

1983

Language

English

Binding

Hardcover.

Condition

Gut

Weight

725 grams

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Physik

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Antiquariat Thomas Haker GmbH & Co. KG
Paul-Robeson-Stra�e 22, Berlin, 10439, Germany

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