Principles of Semiconductor Network Testing (Test & Measurement)

Afshar, Amir

ISBN 10: 0750694726 / ISBN 13: 9780750694728

Published by Newnes, 1995

About this Item

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Bibliographic Details

• Title: Principles of Semiconductor Network Testing (Test & Measurement)
• Publisher: Newnes
• Publication Date: 1995
• Language: English
• ISBN 10: 0750694726
• ISBN 13: 9780750694728
• Binding: Hardcover
• Condition: Good

About this title

Synopsis

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

• Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
• Best new source of information for experienced semiconductor engineers as well as entry-level personnel
• Eight chapters about semiconductor testing

About the Author

National Semiconductor