Progress in Materials Analysis : Vol. 2

M. Grasserbauer

ISBN 10: 3211819053 / ISBN 13: 9783211819050

Published by Springer, Wien, Springer Vienna, Springer, Berlin, 1985

About this Item

Neuware - Vol. 2 of 'Progress in Materials Analysis' contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals . .

Seller Inventory # 9783211819050

Bibliographic Details

• Title: Progress in Materials Analysis : Vol. 2
• Publisher: Springer, Wien, Springer Vienna, Springer, Berlin
• Publication Date: 1985
• Language: English
• ISBN 10: 3211819053
• ISBN 13: 9783211819050
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 229W x 152H x 34D millimeters 229 millimeters width by 152 millimeters height by 34 millimeters depth
• Weight: 650 grams

About this title

Synopsis

Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti­ tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol­ ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .