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Nature, Aim and Methods of Microchemistry: Proceedings of the 8th International Microchemical Symposium Organized by the Austrian Society for ... Chemistry, Graz, Austria, August 25-30, 1980
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Progress in Materials Analysis: Vol. 2 (Mikrochimica Acta Supplementa, 11)
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Condition: New. pp. 364.
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Condition: New. pp. 396.
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Add to basketPaperback. Condition: Brand New. illustrated edition. 364 pages. 9.00x6.00x0.82 inches. In Stock.
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US$ 92.39
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Add to basketPaperback. Condition: Brand New. reprint edition. 396 pages. 9.02x5.98x0.93 inches. In Stock.
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Progress in Materials Analysis: Vol. 1 (Mikrochimica Acta Supplementa, 10)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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US$ 111.83
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Progress in Materials Analysis : Vol. 1
Language: English
Published by Springer Vienna, Springer Vienna, 1983
ISBN 10: 321181759X ISBN 13: 9783211817599
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 11th Colloquium on Metallurgical Analysis - a joint venture of the Institute of Analytical Chemistry of the Technical University in Vienna, the Austrian Society for Analytical Chemistry and Microchemistry, the German Metals Society (DGM), and the Society of German Iron and Steel Engineers (VDEh) - was attended by 120 scientists from 12 nations. The major topics covered were surface, micro and trace analysis of materials with a heavy emphasis on metals. According to the strategy of the meeting attention was focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and tech nology. Therefore progress reports on analytical techniques (like SIMS, SNMS, Positron Annihilation Spectroscopy, AES, XPS) were given as well as pre sentations on the development of materials (like for the fusion reactor). The majority of the discussion papers centered on the treatment of important technical problems in materials science and technology by a (mostly sophis ticated) combination of physical and chemical analytical techniques. The intensive exchange of ideas and results between the scientists oriented towards basic research and the industrial materials technologists was very fruitful and resulted in the establishment of several scientific cooperations. Major trends in materials analysis were also dealt with in a plenary discussion of which a short summary is contained in this volume. In order to facilitate international communication in the field of materials analysis and in view of the important questions treated in the various contri butions this proceedings volume was edited in English.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - th This proceedings volume of the 8 International Microchemical Symposium contains the plenary and keynote lectures delivered at the conference. Besides basic and historic aspects the following major topics are covered: 'Microchemistry Arts and Archeology' in 'Microchemistry in Life Sciences' 'Microchemistry Sciences' in Environmental 'Microchemistry in Material Sciences' 'Instrumentation, Methods and Automation in Microchemistry'. The papers show the present state of microchemistry and the development of this field since the pioneer days of Fritz Pregl and Friedrich Emich. Today microchemistry is a different science as compared to the Pregl and Emich days, for it combines many disciplines like chemistry, physics, mathematics, informatics, biology and does not only mean microanalysi- even if it is still predominant and the best tool for elucidation of the microcosmos. Due to this development modern microchemistry plays an important role in science and technology. It had been the intention of the Scientific th Executive Committee to demonstrate this at the 8 International Micro chemical Symposium with the goal to encourage interdisciplinary communication and stimulate discussion.
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Progress in Materials Analysis : Vol. 2
Language: English
Published by Springer, Wien, Springer Vienna, Springer, Berlin, 1985
ISBN 10: 3211819053 ISBN 13: 9783211819050
Taschenbuch. Condition: Neu. Neuware - Vol. 2 of 'Progress in Materials Analysis' contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals . .
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Add to basketPaperback. Condition: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
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Analysis of Microelectronic Materials and Devices
Language: English
Published by John Wiley & Sons Ltd, 1991
ISBN 10: 0471917133 ISBN 13: 9780471917137
Condition: Gut. Zustand: Gut | Seiten: 980 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Lwdbd. Condition: Zustand in der Beschreibung. 185 S. mit zahlreichen Abb. sowie ein Anhang ("Publikationsliste") Einbandecken und 2 Stellen am unteren Rand leicht gestaucht. Ca. 30 Seiten mit schwachen Markierungen bzw. kleinen Aufklebern. Ansonsten gutes Ex.
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IVC-12 : proceedings of the sessions on the applications of surface science and electronic materials : twelfth international vacuum congress, The Hague, The Netherlands, October 12 - 16, 1992 Volume 2a Applied Surface Science by guest ed.: M. Grasserbauer, A.A. van Gorkum, H. Lueth [et al.] ; general guest ed.: A.W. Kleyn
Published by Amsterdam : North-Holland, 1993, 1993
Seller: Robinson Street Books, IOBA, Binghamton, NY, U.S.A.
Association Member: IOBA
Seller rating 4 out of 5 stars
Condition: Very Good. Prompt Shipment, shipped in Boxes, Tracking PROVIDEDTips bumped else very good. components / electric discharges / electrical engineering / electrical equipment / electronics / interface / radiography / surfaces / x radiation / surface phenomena. Electrotechnology Conference proceedings (ISSN 0169-4332 ; vol. 70/71) Applied surface science. - 417 p.
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Condition: As New. Unread book in perfect condition.
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Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie (German Edition)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Angewandte Oberflächenanalyse Mit Sims Sekundär-ionen-massenspektrometrie Aes Auger-elektronen-spektrometrie Xps Röntgen-photoelektronen-spektrometrie -Language: German
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Angewandte Oberflächenanalyse Mit Sims Sekundär-ionen-massenspektrometrie Aes Auger-elektronen-spektrometrie Xps Röntgen-photoelektronen-spektrometrie -Language: German
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Angewandte Oberfl Chenanalyse Mit Sims Sekund R-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS R Ntgen-Photoelektronen-Spektrometrie
Language: German
Published by Springer Berlin Heidelberg, 2011
ISBN 10: 3642701787 ISBN 13: 9783642701788
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Add to basketPaperback. Condition: Brand New. 312 pages. German language. 9.60x6.80x0.80 inches. In Stock.
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Angewandte Oberflaechenanalyse mit SIMS Sekundaer-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Roentgen-Photoelektronen-Spektrometrie
Language: German
Published by Springer Berlin Heidelberg, 2011
ISBN 10: 3642701787 ISBN 13: 9783642701788
Condition: New.
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Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie
Language: German
Published by Springer Berlin Heidelberg, Springer, 2011
ISBN 10: 3642701787 ISBN 13: 9783642701788
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In Anbetracht der rasch wachsenden Bedeutung der Oberflächenanalytik schien es angebracht, die drei Methoden, welche bereits in einem sehr hohen Maße für die industrielle und forschungsbezogene Routineanalytik eingesetzt und häufig mit einander kombiniert werden, nämlich SIMS, AES und XPS in einer Monographie darzustellen. Um die notwendige Tiefe der Darstellung zu erreichen, wurde dieses Buch nicht von einem Autor verfaßt, sondern greift auf drei verschiedene Autoren mit unter schiedlichen Spezialkenntnissen zurück. Dies garantiert dem Leser die direkte Ver mittlung von theoretischem und experimentellem Wissen auf entsprechendem Niveau für die jeweiligen methodischen Teilgebiete. Anderseits ergeben sich dadurch gewisse Unterschiede in der Darstellungsweise und Symbolik zwischen den drei Kapiteln. Dies ist aber sicherlich von untergeordneter Bedeutung im Vergleich zu der durch Experten zu vermittelnden inhaltlichen Substanz. Die einzelnen Kapitel behandeln SIMS, AES und XPS hinsichtlich methodischem Prinzip, physikalischen Grundlagen, Gerätetechnik, amilytischem Informationsgehalt, qualitativer und quantitativer Analyse und praktischem Einsatz für aktuelle Frage stellungen der Oberflächenanalyse von Festkörpern - insbesondere aus dem Bereich der Werkstoffentwicklung. Die in den einzelnen Kapiteln angeführten Ergebnisse wurden im übrigen mit Hochleistungsgeräten der neuesten Generation erhalten, so daß der derzeitig aktuelle Leistungsstand der- Methodik dargestellt wird. Der Leser soll damit nicht nur eine Methode im Detail kennenlernen können, sondern auch durch die Anführung zahlreicher für das experimentelle Arbeiten wichtiger Daten einen Einstieg in den praktischen Einsatz der Methoden erhalten.
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Condition: Gut. Zustand: Gut | Seiten: 312 | Sprache: Deutsch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie Grasserbauer, M.; Dudek, H.J.; Ebel, Maria F.
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germany
Seller rating 5 out of 5 stars
Hardcover. Condition: gut. 1986. Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie In deutscher Sprache. pages.
