Reliability and Yield Problems of Wire Bonding in Microelectronics: The Application of Materials and Interface Science

Harman, George

ISBN 10: 0930815254 ISBN 13: 9780930815257
Published by Reston, Virginia, U.S.A.: Intl Society of Hybrid, 1989
Language: English
Condition: Used - Fine Hardcover

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Used - Hardcover

Condition: Used - Fine

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