Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)

Reimer, Ludwig; Hawkes, P.W. [Editor]

ISBN 10: 3540639764 / ISBN 13: 9783540639763

Published by Springer, 1998

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Bibliographic Details

• Title: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
• Publisher: Springer
• Publication Date: 1998
• Language: English
• ISBN 10: 3540639764
• ISBN 13: 9783540639763
• Binding: hardcover
• Edition: 2nd Edition
• Condition: New
• Weight: 73 ounces

About this title

Synopsis

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

From the Back Cover

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.