Scanning Electron Microscopy : Physics of Image Formation and Microanalysis

Reimer, Ludwig

ISBN 10: 3540639764 / ISBN 13: 9783540639763

Published by Springer, 1998

About this Item

Zustand: Gut | Seiten: 544 | Sprache: Englisch | Produktart: Bücher | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Seller Inventory # 706699/3

Bibliographic Details

• Title: Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
• Publisher: Springer
• Publication Date: 1998
• Language: English
• ISBN 10: 3540639764
• ISBN 13: 9783540639763
• Binding: Hardcover
• Edition: 2nd Edition
• Condition: Gut
• Seller catalogs:
  • Bücher

About this title

Synopsis

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

From the Back Cover

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.