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Scanning Electron Microscopy and X-Ray Microanalysis

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Published by Springer
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Title: Scanning Electron Microscopy and X-Ray ...
Publisher: Springer
Binding: hardcover
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Goldstein, Joseph I.,Newbury, Dale E.,Michael, Joseph R.,Ritchie, Nicholas W.M.,Scott, John Henry J.,Joy, David C.
Published by Springer, 2017
ISBN 10: 149396674X ISBN 13: 9781493966745
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Goldstein, Joseph I.,Newbury, Dale E.,Michael, Joseph R.,Ritchie, Nicholas W.M.,Scott, John Henry J.,Joy, David C.
Published by Springer, 2017
ISBN 10: 149396674X ISBN 13: 9781493966745
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Goldstein, Joseph I.,Newbury, Dale E.,Michael, Joseph R.,Ritchie, Nicholas W.M.,Scott, John Henry J.,Joy, David C.
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Joseph I. Goldstein|Dale E. Newbury|Joseph R. Michael|Nicholas W.M. Ritchie|John Henry J. Scott|David C. Joy
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of t. Seller Inventory # 310311946

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Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
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ISBN 10: 149396674X ISBN 13: 9781493966745
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Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
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ISBN 10: 1493982699 ISBN 13: 9781493982691
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Published by Springer New York, 2017
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Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
Published by Springer, 2017
ISBN 10: 149396674X ISBN 13: 9781493966745
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Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
Published by Springer, 2018
ISBN 10: 1493982699 ISBN 13: 9781493982691
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Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
Published by Springer, 2018
ISBN 10: 1493982699 ISBN 13: 9781493982691
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