Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Second Edition)

Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Romig, Alton D. Jr.; Lyman, Charles E.; Fiori, Charles; Lifshin, Eric

ISBN 10: 0306441756 / ISBN 13: 9780306441752

Published by Plenum Press, NY, 1992

About this Item

Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine.

Seller Inventory # 009504

Bibliographic Details

• Title: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Second Edition)
• Publisher: Plenum Press, NY
• Publication Date: 1992
• Language: English
• ISBN 10: 0306441756
• ISBN 13: 9780306441752
• Binding: Hardcover
• Edition: 2nd Edition
• Condition: Very Good
• Dust Jacket Condition: Dust Jacket Included
• Seller catalogs:
  • Internet Listing

About this title

Synopsis

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop­ ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

Review

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal