Scanning Tunneling Microscopy and its Application

Chunli Bai

ISBN 10: 3540657150 / ISBN 13: 9783540657156

Published by Springer, Berlin, Springer Berlin Heidelberg, Springer, 2000

About this Item

Neuware - Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

Seller Inventory # 9783540657156

Bibliographic Details

• Title: Scanning Tunneling Microscopy and its Application
• Publisher: Springer, Berlin, Springer Berlin Heidelberg, Springer
• Publication Date: 2000
• Language: English
• ISBN 10: 3540657150
• ISBN 13: 9783540657156
• Binding: Buch
• Edition: 2nd Edition
• Condition: Neu
• Dimensions: 241W x 158H x 33D millimeters 241 millimeters width by 158 millimeters height by 33 millimeters depth
• Weight: 734 grams

About this title

Synopsis

Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

Language Notes

Text: English (translation)
Original Language: Chinese