Scanning electron microscopy : physics of image formation and microanalysis. Springer series in optical sciences ; Vol. 45

Reimer, Ludwig:

ISBN 10: 3540639764 / ISBN 13: 9783540639763

Published by Berlin ; Heidelberg ; Tokyo ; New York ; Barcelona ; Budapest ; Hong Kong ; London ; Milan ; Paris ; Singapore : Springer, 1998

About this Item

XIV, 527 S. : Ill., graph. Darst. ; 24 cm Sprache: Englisch Gewicht in Gramm: 882.

Seller Inventory # 114822

Bibliographic Details

• Title: Scanning electron microscopy : physics of image formation and microanalysis. Springer series in optical sciences ; Vol. 45
• Publisher: Berlin ; Heidelberg ; Tokyo ; New York ; Barcelona ; Budapest ; Hong Kong ; London ; Milan ; Paris ; Singapore : Springer
• Publication Date: 1998
• Language: English
• ISBN 10: 3540639764
• ISBN 13: 9783540639763
• Binding: Pp.
• Edition: 2., completely rev. and updated ed.
• Weight: 882 grams
• Seller catalogs:
  • Physik

About this title

Synopsis

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

From the Back Cover

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.