Semiconductor Interfaces: Formation and Properties : Proceedings of the Workshop, Les Houches, France February 24-March 6, 1987

G. Lelay, J. Derrien et N. Boccara

ISBN 10: 0387183280 / ISBN 13: 9780387183282

Published by Springer Verlag, 1987

About this Item

Ancien livre de bibliothèque. Edition 1987. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Edition 1987. Ammareal gives back up to 15% of this item's net price to charity organizations.

Seller Inventory # D-560-866

Bibliographic Details

• Title: Semiconductor Interfaces: Formation and Properties : Proceedings of the Workshop, Les Houches, France February 24-March 6, 1987
• Publisher: Springer Verlag
• Publication Date: 1987
• Language: English
• ISBN 10: 0387183280
• ISBN 13: 9780387183282
• Binding: Hardcover
• Condition: Très bon

About this title

Synopsis

The trend towards miniaturization of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role upon semiconductor interfaces. Great advances have recently been made in the production of new thin-film materials and in the characterization of their interfacial properties down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures given by specialists at the International Winter School on "Semiconductor Formation and Properties", which was held at the Centre de Physique des Houches from 24 February to 6 March, 1987. The following topics are particularly - Interface formation, including molecular beam epitaxy, the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. - Characterization down to the atomic scale using techniques such as STM, HRTEM, SEXAFS and SEELFS. - Specific physical properties of the interfaces and their prospective device applications.