Boost profits by cutting waste with smart screening in semiconductor production.
This book explains how to speed up wafer starts while keeping quality high by discarding suspected low-yield portions early, rather than testing everything to exhaustion.
This work frames a practical approach to balancing start rates and testing capacity, using real-world data and models. It shows how dependencies in yield across lots, wafers, and chip locations can be detected and exploited to improve profitability without sacrificing reliability.
- How sequential screening can save time and reduce bottlenecks in testing facilities.
- Methods to model yield variability and identify where dependencies most affect production.
- Strategies to choose start rates and screening policies that maximize long-run revenue.
- Numerical results from multiple data sets illustrating profit gains and capacity use.
Ideal for engineers, operations researchers, and managers looking to optimize fab and testing operations used in semiconductor manufacturing.