Sequential Screening in Semiconductor Manufacturing I: Exploiting Lot-To-Lot Variability (Classic Reprint) - Hardcover

Jihong Ou

9780483688902: Sequential Screening in Semiconductor Manufacturing I: Exploiting Lot-To-Lot Variability (Classic Reprint)

Hardcover

ISBN 10: 0483688908 ISBN 13: 9780483688902

Publisher: Forgotten Books, 2018

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Boost profits by cutting waste with smart screening in semiconductor production.

This book explains how to speed up wafer starts while keeping quality high by discarding suspected low-yield portions early, rather than testing everything to exhaustion.

This work frames a practical approach to balancing start rates and testing capacity, using real-world data and models. It shows how dependencies in yield across lots, wafers, and chip locations can be detected and exploited to improve profitability without sacrificing reliability.

How sequential screening can save time and reduce bottlenecks in testing facilities.
Methods to model yield variability and identify where dependencies most affect production.
Strategies to choose start rates and screening policies that maximize long-run revenue.
Numerical results from multiple data sets illustrating profit gains and capacity use.

Ideal for engineers, operations researchers, and managers looking to optimize fab and testing operations used in semiconductor manufacturing.

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