Software Defect and Operational Profile Modeling (Paperback)
Kai-Yuan Cai
ISBN 10: 1461375592 ISBN 13: 9781461375593
Published by Springer-Verlag New York Inc., New York, NY, 2012
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Paperback. also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Seller Inventory # 9781461375593
Synopsis:
also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1
Review:
`This well-crafted summary of research and engineering in software defect estimation and operational profile modeling is a useful addition to the software reliability engineering literature.'
Computing Reviews (June 1999)
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Title: Software Defect and Operational Profile ...
Publisher: Springer-Verlag New York Inc., New York, NY
Publication Date: 2012
Binding: Paperback
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