Studies and Characterization of ZnS Thin Films

Language: English

Published by LAP LAMBERT Academic Publishing Jun 2017, 2017

3330062444 / 9783330062443

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This item is printed on demand - Print on Demand Titel. Neuware -The II-VI compound semiconductors are of great importance due to their application in various electro-optic devices. Thin films of ZnS find many more applications in the area of opto electronic device fabrication like UV light emitting diodes, blue light emitting diodes, emissive flat screens, electroluminescent devices and antireflection coating in solar cell technology. Several methods have been used to prepare ZnS thin films. We have deposited ZnS films using chemical bath deposition method using sodium hydroxide as a complexing agent. The structural and morphological characteristics of films have been investigated by X-ray diffraction (XRD) and scanning electron microscope. XRD shows deposited film was polycrystalline nature with cubic structure. The grain size is estimated to be in the range of 35-70 nm. The crystallinity of the ZnS film was analysed by HRTEM with the help of the electron diffraction pattern. The films show good optical properties with high transmittance in the visible region and the band gap value were found 3.3 eV - 2.1 eV. ZnS films can be used as buffer layers on CdTe solar cells.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 60 pp. Englisch.…

Seller Inventory # 9783330062443

Title
Studies and Characterization of ZnS Thin Films
Author
Arunkumar Alagesan
Publisher
LAP LAMBERT Academic Publishing Jun 2017
Publication year
2017
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3330062444
ISBN 13
9783330062443
Item weight
107 grams
Dimensions
220x150x4 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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