Thermal Testing of Integrated Circuits
Language: English
Published by Kluwer Academic Pub, 2002
- Hardcover
- New
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
AbeBooks seller since January 6, 2003
Condition: New
US$ 178.73
Quantity: 2 available
Add to basketItem description from seller
1st edition. 224 pages. 9.50x6.25x0.50 inches. In Stock.
Seller Inventory # x-1402070764
- Title
- Thermal Testing of Integrated Circuits
- Author
- J. Altet/ Antonio Rubio
- Publisher
- Kluwer Academic Pub
- Publication year
- 2002
- Condition
- Brand New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 1402070764
- ISBN 13
- 9781402070761
- Item weight
- 0.55 kilograms
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
"Synopsis" may belong to another edition of this title.
Revaluation Books
Exeter, United Kingdom
AbeBooks seller since January 6, 2003
Shipping rates from United Kingdom to U.S.A.
| Item | 7 to 14 business days | 2 to 3 business days |
|---|---|---|
| First item | US$ 16.76 | US$ 40.23 |
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Seller's business information
Edward Bowditch Ltd
Exstowe, Exton
Exeter, United Kingdom EX3 0PP
Terms of sale
Legal entity name: Edward Bowditch Ltd
Legal entity form: Limited company
Business correspondence address: Exstowe, Exton, Exeter, EX3 0PP
Company registration number: 04916632
VAT registration: GB834241546
Authorised representative: Mr. E. Bowditch
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